AZoM on MSN

Imaging silicon defects using Raman and PL multivariate imaging

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
Scientific Research Publishing

Cybersecurity and Forensic Audio Analysis: Deepfake Detection Based on Mfcc, Audio-Text Disconsistency, and Prosodic Features ()

1 Department of Computer and Instructional Technologies Education, Gazi Faculty of Education, Gazi University, Ankara, Türkiye. 2 Department of Forensic Informatics, Institute of Informatics, Gazi ...
IEEE

Measuring Canopy Geometric Structure for Crop Yield Estimation Using PCA-Driven Machine Learning Models with Hyperspectral Images

Abstract: The Canopy Geometric Structure for Crop Yield Estimation Using PCA-Driven Machine Learning Models with Hyperspectral Images (CGCPMH) utilizes UAV-mounted hyperspectral imagery for estimating ...
IEEE

Open-Circuit Faults Detection in Three-Phase Inverters Using PCA and WE-SVM Algorithms

Abstract: Open-circuit (OC) faults are a frequent issue in the switching devices of power electronic converters, particularly in three-phase inverters. These faults can lead to significant performance ...