Physics-Constrained Neural Network-Based Compact Modeling of Displacement Damage for AlGaN/GaN HEMTs
Abstract: This article proposes a physics-constrained neural network (PCNN) framework to model displacement damage-induced degradation in AlGaN/GaN high-electron-mobility transistors (HEMTs). The ...
Abstract: Infrared (IR) and visible (VIS) image fusion aims to obtain one comprehensive image, which can be consistent with the source images on details and thermal targets. However, the existing ...
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