Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...
XRGuard: A Model-Agnostic Approach to Ransomware Detection Using Dynamic Analysis and Explainable AI
Abstract: Ransomware remains a persistent and evolving cybersecurity threat, demanding advanced and adaptable detection strategies. Traditional methods often fall short as signature-based systems are ...
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