AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

The chip equipment maker is working with NUS and SIT to speed process development and train engineers for automated ...

Soldier systems operating at the tactical edge are failing not because they lack advanced sensors or autonomy, but because ...

Deeply's 'Listen AI Industrial' has already proven to have 99.87% accuracy in global automaker (Company H) production lines ...

The collaboration connects research lab optimisation with talent pipeline for industry needs. The National University of ...

CPI sensing platform, integrated with Synthesites process monitoring technology, successfully tracked resin flow and ...