Tech Xplore on MSN

Electron microscopy shows 'mouse bite' defects in semiconductors

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...
Semiconductor Engineering

Research Bits: Mar. 3

The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample ...