Abstract: An analytical model for predicting high-linear energy transfer (LET), normal incidence single-event burnout (SEB) voltage in SiC power devices is presented. The concept of critical energy ...
Supported platforms: Windows x64, macOS (Intel + Apple Silicon), Linux x64. IntelliSense data (c_cpp_properties.json) is generated after each successful compile. For a new project, IntelliSense mark ...
Abstract: Negative capacitance Fin Field-Effect Transistors (NC-FinFETs) have emerged as a promising solution for improving the performance of nanoscale semiconductor devices by enhancing ...
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