ICs for automotive applications must satisfy long-term reliability requirements by being insensitive to hard electromechanical stresses. Recently, some studies revealed that the long term robustness ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Saying that advanced ICs are complex is an understatement. The seemingly endless progression to smaller geometries, the ever-increasing integration between analog and digital blocks, and the ...

Sigurd Microelectronics, which specializes in wafer probing and final testing of ICs, expects to enjoy growing revenue generated from orders for automotive chips including networking ICs and MCUs in ...

Traditionally, semiconductor manufacturers used Zener- and link-trimming to calibrate parameters such as output voltage on analog ICs. They performed the trimming at the wafer level, using additional ...

The automotive industry is producing vehicles with increasing levels of real-time decision-making, enabled by thousands of ICs, sensors, and multi-chip packages, but making sure these systems work ...

Electronic system designs often include transient protection to ensure system robustness for electrostatic discharge (ESD) events. Adding external ESD protection without compromising system I/O speed, ...

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced two new modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the ...

International Communications Group (ICG), of Newport News, Va., has completion of testing and receipt of Iridium Certified Equipment (ICE) designation for its NxtLink ICS-220A Iridium Communications ...

The Advantest Corporation (News - Alert) has made available the latest T5831 system, ideal for testing future generation ICs used in mobile applications, to its customers. The ICs include NAND Flash ...

Vijay Sontakke, who works at Intel Corporation as a design engineer, has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing. His ...