Semiconductor Engineering

Standardizing Defect Coverage In Analog/Mixed Signal Test

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...
EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
Assembly Magazine

Micro-Scale Leak Testing of Medical Devices

Given the highly infectious nature of the COVID pathogen, tests for the virus had to be quick, reliable and safe. The test ...
Electronic Design

Using Timing Constraints For Generating At-Speed Test Patterns

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...
Morningstar

Keysight Introduces Scalable, Modular, All-in-One Testing Solution to Accelerate High-Volume PCBA Manufacturing

Compact, modular system with integrated multi-test capability and up to 20-core parallel testing for high-volume efficiency Keysight Technologies, Inc. (NYSE: KEYS) introduces the next generation of ...