Test compression has quickly moved from a luxury item for leading edge companies to a necessity for much of the mainstream market. This is because semiconductor companies manufacturing designs at ...

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

Research from Google found that website bounce rates increase by as much as 31% from one-second to three-second load times. In my experience, page load times are one of the most consistent technical ...

Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

Both launch-off-shift (LOS) and broadside-transition-pattern techniques are finding use in the at-speed test of devices fabricated in 130-nm processes and below. The broadside-transition-pattern ...

Macworld explores essential benchmarking tools to diagnose Mac performance issues and determine whether slowdowns are software or hardware related. Key tools include Geekbench 6 for CPU testing, ...