Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...

The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules. Hierarchical DFT divides the design into smaller pieces, creates test ...

The role of AI and ML in test keeps growing, providing significant time and money savings that often exceed initial expectations. But it doesn’t work in all cases, sometimes even disrupting ...