Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...

The IoT represents a rapidly growing market for which high-speed wireless connections suitable for various usage systems are indispensable. The arrival of digital transportation is accelerating this ...

SANTA CLARA, Calif.—Agilent Technologies Inc. introduces its next-generation parametric test platform, which is designed to meet the evaluation needs of engineers working in semiconductor fabs and ...

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...

EVM testing could be the answer to determining end-to-end performance while greatly reducing test time. As increased levels of integration become more commonplace in wireless designs, new approaches ...