An example of a correlative study between XRM and FIB-SEM has been presented in an earlier study. 1 This article will expand the correlation one step beneath the length scale to link FIB-SEM and TEM, ...
This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
Using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), the researchers have been able to show how the electrode degrades during use, when performing a standardised stress ...
TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
Figure a shows captured exosomes on ligand-baited nanosprings, the exosomes are indicated by the arrows. Figure b shows a TEM image of captured exosomes following negative staining with ...