To read more news from IMS 2006, see the links box in our main IMS story: “RF enables “mobile living room.” Suss MicroTec demonstrated its new |Z| RF probe card for production test as well as its new ...
The HR-E 40-1 passive near-field probe from Langer EMV-Technik measures electrical RF fields up to 40 GHz. Designed to be connected to a spectrum analyzer, oscilloscope, or similar device, the probe ...
A molded RF center probe test socket for devices from 1 to 10 GHz accepts devices from 25 to 55 mm2 wide. It's ideal for manually testing devices with pitches down to 0.50 mm and in packages like CSPs ...
The past decade�s build-up of RF ATE for second-generation (2G) cellular transceivers now is testing more than two billion RF devices annually (Figure 1). Next-generation consumer wireless devices ...
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