A tough challenge for test engineers is explored in terms of test methods, pitfalls, and measurement errors. For the test engineer, RF and microwave power amplifier testing imposes unique challenges.

Despite recent improvements in the performance of RF LDMOS field-effect transistors (FETs), temperature drift and aging continue to affect the efficiency and linearization of power amplifiers using ...

In just a few years’ time, so many things about wireless communication will be different from the way we know them today. Cellular networks, for example, traditionally made up primarily of larger base ...

This document provides guidelines for designing a power amplifier to achieve optimum performance with Maxim’s radio frequency (RF) power amplifier (PA) linearizer (RFPAL) or other types of ...

Demand is increasing for power amplifier chips and other RF devices for 5G base stations, setting the stage for a showdown among different companies and technologies. The power amplifier device is a ...