Wide variation in the way clinical services are provided to similar patients for similar visit types results in highly variable costs but similar clinical outcomes. Objective: To identify optimal ...

As technology nodes shrink to 90 nanometers and below, chips become much more difficult to manufacture. In-die process variations increase substantially at 90 nm — even more at 65 nm. If these effects ...

Revealing another piece of its DFM tool arsenal, Synopsys Inc. today detailed its new process-aware design-for-manufacturing (PA-DFM) tools, meant to analyze variability effects at the custom/analog ...

With semiconductor feature sizes continuing to shrink, the variability arising from process technologies such as strained silicon, as well as the manufacturing processes themselves at 45 nm and below, ...

Chipmakers are pushing into sub-threshold operation in an effort to prolong battery life and reduce energy costs, adding a whole new set of challenges for design teams. While process and environmental ...

In a recent study done by McKinsey and IDC, we see that physical design and verification costs are increasing exponentially with shrinking transistor sizes. As figure 1 shows, physical design (PD) and ...

In this interview, learn how Raman spectroscopy is used as a Process Analytical Technology (PAT) in bioreactor monitoring and control for cultivated meat production. Why look at different ways to ...