Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
FormFactor (www.formfactor.com) has introduced a test platform for automotive devices that can reduce wire bond or system-on-chip device pad pitch as low as 60µm, increase the number of die tested in ...
Precision alignment without consuming too much time. Is this a contradiction of terms? Not with the new LT-VA-5 alignment system by LASER COMPONENTS! This new laser-based system is well suited for the ...
Product burn-in (BI) is an indispensable step in the production test flow to ensure good quality and a properly functioning product for the customer. Amkor takes pride in rating ‘quality delivered to ...
Distribution Control Systems, Inc. (DCSI), a subsidiary of ESCO Technologies Inc., has released system components that enable its new AMIgo system to manage and deliver vastly increased numbers of two ...
Before a chip design is turned from a hardware design language (HDL) like VHDL or Verilog into physical hardware, testing and validating the design is an essential step. Yet simulating a HDL design is ...
The addition of multiple cores to microprocessors has created a significant opportunity for parallel programming, but a killer application is needed to push the concept into the mainstream, ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback