Electronic Design

Output Capacitance Optimization and Picking the Right Slammer—An Introduction

Existing test solutions aren’t always suitable for the latest improvements in switching regulator technology. Transient load testing can address these inequities. In response to the recent ...
Electronic Design

Test Pattern Compression Saves Time and Bits

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...
EDN

Design for test boot camp, part 4: Built-in self-test

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...
Business Wire

RaySafe X2 Volt Sensor Makes It Easier Than Ever to Perform Measurements on X-ray Machine Voltage Output Test Points

EVERETT, Wash.--(BUSINESS WIRE)--Measuring low voltage test points on particular X-ray machines has required an oscilloscope which could be a time-consuming measurement. The new X2 Volt Sensor makes ...
Design-Reuse

Resolution of Interoperability challenges in Automatic Test Point insertion across different EDA vendors

In both of the above cases the outcome will be a file having Test Point type and location where it has to be inserted (along with other relevant information dependent on tool eg. probable equivalent ...