TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Recent surveys of working engineers in the electronics industry by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory and memory buses on circuit boards is one of ...
EIGHTY-FOUR, PA.—Long ago, storage components were principally ranked by the individual physical capacity of the device, or in the case of JBODs (just a bunch of disks), the array. As technologies ...
May 15, 2012. Advantest Corp. has announced the availability of its next-generation high-speed DRAM test system, the T5511. Advantest says the new system, which begins shipping this month, offers the ...
A few months ago, SanDisk quietly launched a new 2TB Extreme Pro SD memory card, able to store over 2,800 minutes of 4K UHD video and offering read speeds of up to 250MB/s and write speeds of up to ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results