Like a bad vending machine that takes your money without coughing up the product, a damaged memory card can seemingly eat your data. In some cases, you may be able to stick your hand down the card's ...

Index-based repair capabilities in STAR Memory System cut memory repair cycles from more than 1000 to fewer than 100 cycles by testing only faulty memories Enhanced hardware and algorithm support in ...

Reigning as the only commercially available embedded memory self-test and repair system, the third-generation STAR memory system adds enhancements that promise faster time-to-market, lower test costs, ...

DesignWare STAR Memory System for Embedded Flash Reduces Test Cost by 20 Percent and Enables In-Field Diagnostics for IoT and Automotive SoCs MOUNTAIN VIEW, Calif., Oct. 20, 2014-- Synopsys, Inc.

Typically, we see a 4X increase in memory size every 3 years to cater to the needs of new generation devices. Deep submicron devices contain a large number of memories which demands lower area and ...

Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...

Three-dimensional (3D) memory integration marks a significant advancement in semiconductor technology, enabling higher device densities and enhanced performance for modern applications. However, the ...

Tesla electric vehicles can feel more computer than car with software updates, that sleek touchscreen, and a memory drive that can fill up in the blink of an eye. That last one is a big issue, since ...

SOC (system-on-chip) designs often incorporate multiple instantiations of various types of memories, including single-port, double-port, and content-addressable memories of various sizes and cuts. In ...