Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...
Typically, we see a 4X increase in memory size every 3 years to cater to the needs of new generation devices. Deep submicron devices contain a large number of memories which demands lower area and ...
November 9, 2012. Synopsys Inc. has announced a new release of its DesignWare STAR Memory System, an automated pre- and post-silicon memory test, debug, diagnostic and repair solution that enables ...
The number of embedded memories contained within an SoC continues to grow rapidly. This growth has driven the need for rethinking manufacturing test strategies as embedded memories represent in most ...
ARM has announced the availability of its emBISTRx embedded-memory test and repair system that is tightly integrated with the ARM Advantage and Metro memory compilers, which in turn is part of its ...
Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...
San Jose, Calif. - May 6, 2003 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test for integrated circuits announces the availability of a silicon proven solution that provides ...
Three-dimensional (3D) memory integration marks a significant advancement in semiconductor technology, enabling higher device densities and enhanced performance for modern applications. However, the ...
At The BYTE Shop in Jamaica Plain, there are several neat rows of old computers prominently on display. They caught the eye of Peter Ashbourne and his young grandson, Teddy, during their walk one ...
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