Some fabs build consumer chips that sit inside phones and laptops. Others build chips that must survive in orbit, under the Arctic ice, or deep beneath the Earth’s surface. Fabs serving defense, ...

Metrology tool vendor Rudolph Technologies Inc. took the wraps off a suite of macro defect equipment today, claiming that it can produce real-time inspection on each critical lithography and wafer ...

FLANDERS, N.J.--(BUSINESS WIRE)--Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, ...

“Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive,” said Microtronic CEO Reiner Fenske in making the announcement. “Today’s fabs ...

April 15, 2013. Rudolph Technologies Inc., a provider of process characterization equipment and software for the semiconductor and related industries, announced that it has sold an NSX Series macro ...

The macro defect detection sector of the metrology market will grow nearly 25 percent on top of a near 180 percent increase last year, according to market forecasters at The Information Network. This ...

Rudolph Technologies, Inc. RTEC, a leader in the design, development, manufacture and support of defect inspection, lithography, metrology, and process control software used by semiconductor and ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

Provides process control tools for macro defect inspection, 2D/3D optical metrology, lithography systems, and process control analytical software, with additional revenue from spare parts and software ...

Added 31,096 shares, increasing position value by approximately $4.48 million. Transaction represents an approximately 0.89% change in 13F reportable assets under management. Provides process control ...