This reference design describes a cost-effective, low-power liquid-level measurement data acquisition system (DAS) that use a compensated silicon pressure sensor and a high-precision delta-sigma ADC.

New liquid-cooling enabled system delivers affordable, high-density SLT and burn-in test for high-demand, lower-volume HPC, AI, and automotive devices TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading ...

Covering the history and trends of system-level test for semiconductors, this solution brief discusses: The increasing complexities of testing advanced semiconductor integrated devices across a span ...

The control systems world is changing. Historically, process control systems—which include all industrial control, process control, supervisory control and data acquisition (SCADA), distributed ...