Semiconductor fabs—among the most heavily instrumented manufacturing facilities in today’s industrial landscape—continue to grow and generate data throughout the manufacturing process, making the term ...

The testing and characterization of organic electronic devices is becoming an increasingly important aspect of this growing sector, and the United Kingdom’s National Physical Laboratory (NPL) is ...

Part Average Testing, or PAT, is used for outlier detection for a single measurement, a requirement for automotive electronics, found in the Automotive Electronics Councils‘ AEC – Q001 Rev-D ...

ICs for automotive applications must satisfy long-term reliability requirements by being insensitive to hard electromechanical stresses. Recently, some studies revealed that the long term robustness ...