The air taxi has been developed specifically for Indian conditions, with a design that accounts for dust, harsh weather and ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...

MUNICH--(BUSINESS WIRE)--Cadence Design Systems, Inc. (NASDAQ: CDNS) today introduced the Cadence ® Legato™ Reliability Solution, the industry’s first software product that meets the challenges of ...

Times are changing fast. Take the automotive industry for example. Software has evolved far beyond infotainment, now controlling everything in the car, including braking and steering for the driver.

When it comes to process-control systems, reliability is crucial and failure can be costly or dangerous. A combination of good design practices, component selection, and testing can enhance ...

How can systems be designed to guard against unexpected downtime? How does system reliability impact product development? In what ways can artificial intelligence and machine learning improve system ...

Digital twins dominated discussions at SEMICON West this year, appearing in keynote presentations, panel sessions, and workshops. The conversation reflected a noticeable shift in how the industry ...

The study of lifetime distribution and reliability testing seeks to characterise the statistical behaviour of time-to-failure data for components and systems across a range of applications, from ...

[This article was first published in Army Sustainment Professional Bulletin, which was then called Army Logistician, volume 1, number 2 (November–December 1969), pages 8–11, 24–25.] “… in the process ...