Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

When it comes to analyzing living cells, challenging biological samples and thick, multilayer tissue samples require purposefully designed instrumentation. BioAFMs are ideal when it comes to these ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...